IonVision excels at Airborne Molecular Contamination (AMC) monitoring with sub-PPB level identification of ammonia and total acids!
With a lot of strategic investment now going into developing the semiconductor industry in Europe, we decided to study how well our IonVision DMS would fit into the field. Monitoring airborne molecular contamination is key in semiconductor manufacturing and even sub-ppb levels of ammonia or acids can be detrimental to the quality of the finished products. Some existing solutions for AMC monitoring can typically measure either ammonia or acids, but with IonVision, simultanenous measurement is possible due to its inherent measurement of positive and negative product ions at the same time. Our recent laboratory tests demonstrated that in a clean background, the sensitivity for ammonia and simple acids is in the parts-per-trillion (PPT) range (<100 PPT).
We are excited to develop the platform further to provide a reliable fully clean-room compatible system in the near future. If you are looking for a European option for AMC monitoring, contact us!


